Volk, R.R.VolkNeumann, E.E.NeumannWarrikhoff, A.A.WarrikhoffHanke, R.R.HankeKasperl, S.S.KasperlFunk, C.C.FunkHiller, J.J.HillerKrumm, M.M.KrummSudarsan, A.A.SudarsanSukowski, F.F.SukowskiUhlmann, N.N.UhlmannBehrendt, R.R.BehrendtSchmitt, R.R.SchmittHamacher, A.A.HamacherDamm, B.B.Damm2022-03-112022-03-112009https://publica.fraunhofer.de/handle/publica/36243110.1117/12.827330en621Soft X-ray projection system for robust roundness measurementsconference paper