Pfeiffer, W.W.PfeifferPrümmer, R.R.PrümmerReisacher, E.E.Reisacher2022-03-022022-03-021989https://publica.fraunhofer.de/handle/publica/177935In a ß-Lithium-Aluminium-Silicon-Oxide glass ceramic X-ray stress measurements were performed. The cristalline phase investigated is ß-Eukryptite. The X-ray elastic constants were deterined at (118) - lattice planes using CrK alpha radiation. The surface stress state is determined as a function of depth below surface.enBeta-EukryptitEinkristallkoeffizientGlaskeramikKeramikRöntgenelastizitätskonstanteSpannungsmessung531620669journal article