Wolber, R.R.WolberGläser, U.U.GläserVierhaus, H.T.H.T.Vierhaus2022-03-092022-03-091994https://publica.fraunhofer.de/handle/publica/32371810.1109/ICCD.1994.331924en005006629Testability analysis for test generation in synchronous sequential circuitsconference paper