Molter, D.D.MolterKolano, M.M.KolanoKlier, J.J.KlierWeber, S.S.WeberJonuscheit, J.J.JonuscheitFreymann, G. vonG. vonFreymann2022-03-152022-03-152020https://publica.fraunhofer.de/handle/publica/41229610.1109/IRMMW-THz46771.2020.9370629We recently demonstrated the use of incoherent light from a superluminescent diode to drive a terahertz crosscorrelation spectroscopy system. Its application to layer-thickness measurement tasks is the scope of this contribution. The limitations and a comparison to layer-thickness measurements with a standard time-domain spectroscopy system is discussed with a special focus of the bandwidth-dependence of the layer-thickness evaluation result.en003006519conference paper