Turek, M.M.Turek2022-03-042022-03-042014https://publica.fraunhofer.de/handle/publica/23625910.1063/1.4871017Precise knowledge of the series resistance is essential for failure and loss analysis as well as yield prediction of solar cell devices. In this work, a method which determines the current and photogeneration dependence of the series resistance without assuming any specific current-voltage characteristic for the internal diodes is presented. This approach is of particular interest for solar cells which cannot be described by the one-or two-diode model such as organic solar cells. Furthermore, it clarifies the difference in the series resistance values that are obtained from current-voltage curves in the dark and under illumination as well as short-circuit-current and open-circuit-voltage characteristics. Additionally, it is shown how other cell parameters, such as the shunt resistance or the current-voltage characteristic of the internal diode are determined in a consistent way. Finally, it is demonstrated that our approach can be easily implemented in a new generation of solar simulators that are based on light-emitting diodes instead of conventional light sources.en530journal article