Fratz, MarkusMarkusFratzSeyler, TobiasTobiasSeylerSchiller, AnnelieAnnelieSchillerBertz, AlexanderAlexanderBertzCarl, DanielDanielCarl2022-10-272022-10-272022https://publica.fraunhofer.de/handle/publica/4280112-s2.0-85141480196We present a novel approach for detecting the absolute position of surfaces in multi-wavelength holography. We extent the depth of field from ~0.08 mm to ~3 mm and get the absolute position with accuracies better than 10 µm.enDigital holographic imagingMulti-wavelength holographyAbsolute distance measurementImage qualityExtended depth of fieldSolid state lasersHigh speed photographyExtended depth of field with absolute position detection in multi-wavelength digital holographyconference paper