Pruemmer, R.R.PruemmerPfeiffer-Vollmar, H.W.H.W.Pfeiffer-Vollmar2022-03-082022-03-081986https://publica.fraunhofer.de/handle/publica/314212X-ray stress analysis is based upon the measurement of changes of lattice parameters in polycrystalline materials and has been widely applied to metallic materials. Also, with ceramic materials it is often desirable to relate residual stress values with strength data. For Si sub 3 N sub 4 and SiC the procedure for X-ray residual stress analysis is developed. The X-ray elastic constants are determined. Examples of the determination of residual surface stresses of finished parts for high temperature application are described. First results about the influence of heat-treatment and mechanical surface working on residual stresses of ceramics are presented.en531620conference paper