Roehner, M.M.RoehnerMuentz, H.H.MuentzSchroeder, O.O.SchroederBoucke, K.K.BouckePoprawe, R.R.Poprawe2022-03-092022-03-092003https://publica.fraunhofer.de/handle/publica/34306310.1117/12.472390High beam quality can be achieved by accurate adjustment of the mechanical and microoptical components in the manufacturing process of high power diode laser stacks. A characterization device which can determine these parameters by automatically measuring the radiation properties of high-power diode-laser stacks has been developed. The result is a mechanically robust, easy to use characterization device of high reliability suited for applications in quality control and product optimization.enhigh power diode laserstackbeam qualitypropagationcharacterization621conference paper