Kiefer, U.U.KieferBecker, K.-D.K.-D.BeckerGebhardt, W.W.GebhardtWalte, F.F.Walte2022-03-082022-03-081989https://publica.fraunhofer.de/handle/publica/316326System identification methods are applied to develop a parametric model of an ultra-sonic inspection situation consisting of a normal probe and a specimen. To simulate the probe behaviour at varying physical properties, a theoretical model is calculated to generate synthetic data. The comparison of the properties of the parametric model with that of the real or simulated probe shows a good agreement.enPrüfkopfcharakterisierungPrüfkopfmodellierungUltraschallprüfung620658670conference paper