Fritz, JoachimJoachimFritzLackmann, RainerRainerLackmann2022-03-082022-03-081990https://publica.fraunhofer.de/handle/publica/302450A device permits the non-destructive measurement of absolute voltages, particularly on conductors in CMOS circuits. It comprises a laser device, an electro- optical active crystal and an interference set-up for generating an interference between the laser beam and one of the beams reflected by the integrated circuit, such interference serving as a guide for the voltage to be measured.de608621patent1989-3920495