Investigating HCI and BTI degradation in 4H-SiC CMOS

Under CopyrightLange, AndréAndréLangeWinkler, SophieSophieWinklerOrtstein, KatrinKatrinOrtsteinMay, AlexanderAlexanderMayRommel, MathiasMathiasRommel2023-07-212023-07-212023-04https://publica.fraunhofer.de/handle/publica/445840https://doi.org/10.24406/publica-166510.24406/publica-1665enDDC::000 Informatik, Informationswissenschaft, allgemeine WerkeInvestigating HCI and BTI degradation in 4H-SiC CMOSposter