Lennartz, WilhelmWilhelmLennartzMetzger, StefanStefanMetzger2022-03-082022-03-082007https://publica.fraunhofer.de/handle/publica/307956Verfahren zur Beeinflussung der Arbeitsfrequenz eines Schwingquarzes oder Quarzoszillators, bei welchem der Schwingquarz oder der Quarzoszillator mit einer elektromagnetischen Strahlung mit einer Wellenlaenge von wenigser als 2,5 nm beaufschlagt wird.DE 102005054745 A1 UPAB: 20071015 NOVELTY - The method involves charging an oscillating quartz resonator with an electromagnetic radiation with a wavelength of less than 2.5 nano meter, such that an operating frequency of the oscillating quartz is reduced. A dose of 1 gray to 30 gray is doped on the oscillating quartz. The oscillating quartz is inserted into a quartz oscillator (1) before the irradiation, where the oscillator is installed in an electronic circuit carrier before the irradiation. USE - Used for influencing an operating frequency of an oscillating quartz of a quartz oscillator that is utilized in a vehicle control system, personal computer, mobile telephone and control and regulating device of machines and plants. ADVANTAGE - The oscillating quartz is charged with the electromagnetic radiation with the wavelength less than 2.5 nano meter, thus enabling to change the operating frequency of the oscillating quartz to a specified rated frequency without additional electronic components in a simple manner.de620Verfahren zur Beeinflussung der Arbeitsfrequenz eines SchwingquarzesOscillating frequency influencing method for quartz oscillator, involves charging oscillating quartz resonator with electromagnetic radiation of specific wavelength, such that operating frequency of resonator is reducedpatent102005054745