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X-ray free-electron lasers: beam diagnostics, beamline instrumentation, and applications II
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Title
X-ray free-electron lasers: beam diagnostics, beamline instrumentation, and applications II
Titel Supplements
18 - 19 August 2014, San Diego, California, United States
Institut
Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.
Verlag
SPIE
Verlagsort
Bellingham, WA
Datum
2014
Serie
Proceedings of SPIE
Konferenz
Conference "X-Ray Free-Electron Lasers - Beam Diagnostics, Beamline Instrumentation, and Applications" 2014