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  4. Curing-in-the-loop strategy for multidimensional-shrinkage compensation in active alignment FAC assembly
 
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2018
Presentation
Titel

Curing-in-the-loop strategy for multidimensional-shrinkage compensation in active alignment FAC assembly

Titel Supplements
Presentation held at Conference "Components and Packaging for Laser Systems IV", 27 January - 1 February 2018, San Francisco, California, United States, Published online only on SPIE Proceedings Volume 10513
Abstract
Tight tolerances for the final position and orientation of optical components are best controlled in automated and high volume production with statistical process control. Semi-automated and low-volume scenarios on the other hand are in need for a suitable approach, capable to react resiliently on remaining uncertainties of the bonding process. Active alignment has proven to lower the tolerances for finding the optimal position regarding the overall performance. We will present a novel shrinkage-compensation strategy, which extends the active control loop to integrate the curing process. We will discuss the adhesive properties necessary for the realization of our strategy and our measurement equipment used for the characterization of such properties. Besides a predicable shrinkage curve, the critical cross-linking level, until no further manipulation is possible, is a key factor. Furthermore, the machine concept, the curing capabilities and the active evaluation needs to follow special requirements. Since the shrinkage-behavior is highly sensitive to the amount of UV, the effective power on the adhesive needs to be controlled by optimizing the orientation of the light source. We integrated the UV-light in our micromanipulator in order to always ensure an optimal illumination In order to apply regression analysis for a multidimensional shrinkage model, misalignments in the selected degrees of freedom must be observable with sufficient precision. As validation of our strategy, we examine the collimation of a diode laser bar.
Author(s)
Zontar, Daniel
Fraunhofer-Institut für Produktionstechnologie IPT
Müller, Tobias
Fraunhofer-Institut für Produktionstechnologie IPT
Sauer, Sebastian
Fraunhofer-Institut für Produktionstechnologie IPT
Baum, Christoph
Fraunhofer-Institut für Produktionstechnologie IPT
Brecher, Christian
Fraunhofer-Institut für Produktionstechnologie IPT
Konferenz
Conference "Components and Packaging for Laser Systems" 2018
Thumbnail Image
DOI
10.1117/12.2290897
Language
English
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Fraunhofer-Institut für Produktionstechnologie IPT
Tags
  • Adhesives

  • Assembly tolerances

  • Semiconductor lasers

  • Tolerancing

  • Ultraviolet radiation...

  • Collimation

  • Light sources

  • Optical components

  • Packaging

  • Process control

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