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  4. Ferroelectric and antiferroelectric Hf/Zr oxide films: Past, present and future
 
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2021
Konferenzbeitrag
Titel

Ferroelectric and antiferroelectric Hf/Zr oxide films: Past, present and future

Abstract
Ferroelectric and antiferroelectric Hf/Zr-based oxide films have recently gained interest for memory and AI applications due to their promise of low power and CMOS compatibility. As Hf/Zr-based oxides are not 'new' materials, this paper will start with an overview of past learning on this material system. Recent results on fundamental understanding of the mechanism of ferroelectric and antiferroelectric switching will be presented. Challenges in implementation of this material system in high volume manufacturing will be discussed.
Author(s)
Triyoso, D.H.
America, LLC, Albany, NY, USA
Clark, R.D.
America, LLC, Albany, NY, USA
Weinreich, W.
Fraunhofer-Institut für Photonische Mikrosysteme IPMS
Mart, C.
Fraunhofer-Institut für Photonische Mikrosysteme IPMS
Kämpfe, T.
Fraunhofer-Institut für Photonische Mikrosysteme IPMS
Consiglio, S.
America, LLC, Albany, NY, USA
Mukundan, V.
SUNY Polytechnic Institute, Albany, NY, USA
Diebold, A.C.
SUNY Polytechnic Institute, Albany, NY, USA
Tapily, K.
America, LLC, Albany, NY, USA
Wajda, C.
America, LLC, Albany, NY, USA
Leusink, G.
Hauptwerk
International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA 2021
Konferenz
International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) 2021
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DOI
10.1109/VLSI-TSA51926.2021.9440135
Language
Englisch
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