Single event effects by atmospheric neutrons in commercial (COTS) normally-off GaN HEMT
Titel Supplements
Poster presented at 30th European Conference on Radiation and its Effects on Components and Systems, RADECS 2019, Montpellier, France, September 16-20, 2019
Abstract
Results of SEE testing of commercial high power normally-off GaN-devices with an atmospheric-like neutron spectrum at ChipIR are presented. Three different designs of GaN-HEMTs and one SiC-MOSFET were tested at different voltages and the cross sections were determined.
