Comprehensive radiation characterization of digital isolators

We investigate TID radiation response and SEE susceptibility of six different digital isolators by exposing them to Co-60 gammas with 300 krad(Si) and various proton and heavy ion fields with LET of up to 60 MeV·mg-1·cm2. The type with the least radiation degradation was also exposed to 10 MeV electrons and 14 MeV neutrons.