Pulsed laser beam identification of SEE-sensitive regions and observation of additional failure modes relevant for RHA in Digital Isolators
Titel Supplements
Poster presented at European Conference on RADiation Effects on Components and Systems, RADECS 2017, Geneva, Switzerland, October 2nd - 6th, 2017
Alternative
Mapping of SEE-sensitive regions and locating of additional failure modes relevant for RHA in digital isolators
Abstract
A pulsed laser mapping of Digital Isolators, previously characterized with heavy ions at RADEF, not only identified the regions sensitive to single-event effects (SEE) but also revealed additional failure modes (i.e. high-frequency ringing and latchup) not seen during heavy ion testing. So this device was considered latchup free up to an LET of 60 MeV cm2 / mg. But those effects could also be induced by highly penetrating particles and hence must be taken into account for radiation hardness assurance (RHA). In addition it was possible to measure the sensitive area for the different types of SEE at different laser energies.
