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  4. Generation dependence of ICT device IEMI vulnerability
 
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2016
Presentation
Titel

Generation dependence of ICT device IEMI vulnerability

Titel Supplements
Paper presented at EUROEM 2016, European Electromagnetics Symposium, 11-14 July 2016, London
Abstract
Immunity of electronic devices against (I)EMI may be subject to generational changes since baseline technologies constantly evolve. We submitted mobile phones from time frames spanning sixteen years in total as well as two succeeding generations of tablet computers to HPM pulses in order to probe their robustness. Such devices are widely used in critical infrastructures, thus risking to present targets for IEMI attacks. While rising device complexity and miniaturization may imply problems, average immunity of newer devices has in parts even improved, possibly due to inner EMC concerns.
Author(s)
Adami, Christian
Fraunhofer-Institut für Naturwissenschaftlich-Technische Trendanalysen INT
Jörres, Benjamin
Fraunhofer-Institut für Naturwissenschaftlich-Technische Trendanalysen INT
Jöster, Michael
Fraunhofer-Institut für Naturwissenschaftlich-Technische Trendanalysen INT
Pusch, Thorsten
Fraunhofer-Institut für Naturwissenschaftlich-Technische Trendanalysen INT
Suhrke, Michael
Fraunhofer-Institut für Naturwissenschaftlich-Technische Trendanalysen INT
Taenzer, Achim
Fraunhofer-Institut für Naturwissenschaftlich-Technische Trendanalysen INT
Konferenz
European Electromagnetics Symposium (EUROEM) 2016
DOI
10.24406/publica-fhg-394740
File(s)
N-432410.pdf (69.47 KB)
Language
English
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Fraunhofer-Institut für Naturwissenschaftlich-Technische Trendanalysen INT
Tags
  • IEMI

  • HPM

  • susceptibility

  • cell phone

  • tablet

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