2011
Conference Paper
Titel

Influence of beam conditions and energy for SEE testing
Abstract
The effects of heavy-ion test conditions and beam energy on device response are investigated. These effects are illustrated with two types of test vehicles; SRAMs and power MOSFETs. In addition, GEANT4 simulations have also been performed to better understand the results.
Author(s)
Ferlet-Cavrois, V.
Schwank, J.R.
Liu, S.
Muschitiello, M.
Beutier, Th.
Javanainen, A.
Hedlund, A.
Poivey, C.
Zadeh, A.
Harboe-Sorensen, R.
Santin, G.
Nickson, B.
Menicucci, A.
Binois, C.
Peyre, D.
Hoeffgen, S.K.
Metzger, S.
Schardt, D.
Kettunen, H.
Virtanen, A.
Berger, G.
Piquet, B.
Foy, J.-C.
Zafrani, M.
Truscott, P.
Poizat, M.
Bezerra, F.
Hauptwerk
Konferenz
Thumbnail Image
DOI
Language
English