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  4. Lifetime analysis of photoconductive THz emitters
 
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2011
  • Konferenzbeitrag

Titel

Lifetime analysis of photoconductive THz emitters

Abstract
The durability of photoconductive Terahertz emitters significantly depends on bias voltage and/or optical power. We analyze the optimum operation conditions of photomixers for long-term performance and link the accessible signal-to-noise ratio to the photomixer lifetime via an Arrhenius analysis.
Author(s)
Gobel, T.
Schoenherr, D.
Sydlo, C.
Feiginov, M.
Meissner, P.
Hartnagel, H.L.
Hauptwerk
36th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2011
Konferenz
International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) 2011
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DOI
10.1109/irmmw-THz.2011.6104776
Language
Englisch
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