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2010
Conference Paper
Title

Nano-porous gold interconnect

Abstract
Nanoporous gold has been deposited on silicon wafers by electroplating a silver-gold alloy followed by etching the silver. An open-porous cellular structure of gold at nano- or meso-scale is left. Nanoporous bumps were formed, which have been used for flip chip bonding. We found low temperature and low force bonding conditions which are similar to sintering. The porous interconnects show very promising properties, like compressibility and reduced stiffness, which should result in higher bond yield and extended reliability. Keywords: bumping, flip chip, nano-sponge, cellular structure, sintering.
Author(s)
Oppermann, H.
Dietrich, L.
Klein, M.
Wunderle, B.
Reichl, H.
Mainwork
International Conference and Exhibition on Device Packaging 2010. Vol.3  
Conference
International Conference and Exhibition on Device Packaging 2010  
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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