Investigation of minimum phase components in Si3N4 ceramics.

The contribution shows one of the first applications of a new system for XRD measuring and data analysis. It contains a physical based profile model improving the security of peak parameter determination in contrast to former models. Basing on the accurate profile fitting a method for "optimal experimental design" is used, which further improves the accuracy of selected parameters and reduces the needed measuring time. Therefore the method is specially suitable for preparing qualitative and quantitative phase analysis. The system was tested at dense non- oxidic structural ceramics with lowest secondary phase amounts.