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Development and electrical characterization of a metal-ferroelectric-insulator semiconductor FET test structure
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2016
Master Thesis
Titel
Development and electrical characterization of a metal-ferroelectric-insulator semiconductor FET test structure
ThesisNote
Dresden, TU, Master Thesis, 2016
Author(s)
Ali, Tarek
Advisor
Müller, Johannes
Fraunhofer-Institut für Photonische Mikrosysteme IPMS
Lakner, Hubert
Technische Universität <Dresden, Germany>
Beteiligt
Heyns, Marc
Verlagsort
Dresden
File(s)
N-425940.pdf (8.67 MB)
Language
Englisch
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