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Comparative TEM and HRXRD analyses of strain relaxation in step-graded GaInAs buffer-layers for high-efficiency solar cells
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2006
Zeitschriftenaufsatz
Titel
Comparative TEM and HRXRD analyses of strain relaxation in step-graded GaInAs buffer-layers for high-efficiency solar cells
Author(s)
Schöne, J.
Spiecker, E.
Jäger, W.
Dimroth, F.
Bett, A.W.
Zeitschrift
Microscopy and microanalysis
DOI
10.1017/S1431927606064774
Language
Englisch
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