Investigation of latent and short etched heavy ion tracks in solids
Abstract
In the past five years were carried out SANS (Small-Angle Neutron Scattering) measurements in the JINR to investigate latent and short etched tracks in SSNTD. The results demonstrate the suitability of the method to study not etched and short etched tracks to analyse the etching process, e.g. for nuclear track filter production. The reuslts are in good agreement with other methods as conductivity measurements.
