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  4. Benchmarking AI-Based Monocular Depth Estimators in Terms of Their Metrological Potential Following 3-D Sensor Guideline VDI/VDE 2634
 
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2026
Journal Article
Title

Benchmarking AI-Based Monocular Depth Estimators in Terms of Their Metrological Potential Following 3-D Sensor Guideline VDI/VDE 2634

Abstract
Monocular depth estimation is a computer vision task in which a neural network is trained to estimate depth maps from given images. Recently, some estimators have reached remarkable results with potential to replace conventional 3-D sensors in certain applications. To investigate how they compare in terms of metrological performance, we applied the VDI/VDE 2634 evaluation guideline from the 'Verein Deutscher Ingenieure e.V.' This guideline is used to specify the probing and length measurement errors of a 3-D sensor by capturing data from a calibrated ball bar specimen in different orientations within a predefined measurement volume. We evaluated three recent monocular depth estimators Depth Anything V2, Depth Pro, and UniDepthV2 in different settings, which achieved probing and length measurement errors below 10 % under optimal conditions. However, under nonoptimal conditions, each of the three depth estimators showed significant errors. Adding everyday objects into the image scenes improved the overall results. Our image collection, the MD-VDI2634 dataset, enables the investigation and comparison of depth estimators regarding their metrological performance.
Author(s)
Ramm, Roland  
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Li, Yang
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Oberdörster, Alexander  
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Heist, Stefan  
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Notni, Gunther  
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Kühmstedt, Peter  
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Journal
IEEE sensors letters  
Funder
Bundesministerium für Forschung, Technologie und Raumfahrt  
Open Access
File(s)
Download (4.63 MB)
Rights
CC BY-NC-ND 4.0: Creative Commons Attribution-NonCommercial-NoDerivatives
DOI
10.1109/LSENS.2025.3647147
10.24406/publica-10091
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Keyword(s)
  • benchmark dataset

  • length measurement error

  • monocular depth estimation

  • probing error

  • Sensor applications

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