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  4. Electronic structure of single delta-doped GaAs layers studied by photoluminescence and raman spectroscopy.
 
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1990
Conference Paper
Title

Electronic structure of single delta-doped GaAs layers studied by photoluminescence and raman spectroscopy.

Other Title
Elektronische Struktur einfach delta-dotierter GaAs Schichten untersucht mittels Photolumineszenz und Ramanspektroskopie
Abstract
Radiative recombination of quasi-two-dimensional electrons with photocreated holes is reported for single silicon delta-doped layers in GaAs. These holes are confined within the potentail induced by the doping spike, which is repulsive for holes, and an Al0.33Ga0.67As/GaAs heterointerface. It is shown by photoluminescence and Raman spectroscopy that the density of carriers created by cw photoexcitation can be made sufficiently high to modify the actual shape of the doping induced potential well.
Author(s)
Ploog, K.
Wagner, J.
Mainwork
20th International Conference on the Physics of Semiconductors 1990  
Conference
International Conference on the Physics of Semiconductors 1990  
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • delta-doping

  • Delta-Dotierung

  • electronic structure

  • elektronische Struktur

  • GaAs

  • optical spectroscopy

  • optische Spektroskopie

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