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  4. Ultrasonic Bonding of AlCu Wire - An Advance to Reliable Interconnects for Power Modules
 
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2025
Conference Paper
Title

Ultrasonic Bonding of AlCu Wire - An Advance to Reliable Interconnects for Power Modules

Abstract
Aluminum cladded copper core (AlCu) composite wire is investigated as an advanced interconnect material for power modules, which combines aluminium's bonding compatibility with copper's superior electrical and thermal properties. Fusing current tests on 500-μm diameter wires revealed that AlCu wire achieves a fusing current capacity of 32.5 A, surpassing pure aluminum wire at 29.5 A and approaching copper wire at 4 5. 6 A. Incorporating a copper core increases the tensile strength of the AICu wire to approximately three times that of conventional aluminium wire, resulting in increased stiffness and higher bonding forces required during ultrasonic bonding, which risks damaging chip pads. To address this issue, the freshly produced wire was subjected to a controlled heat treatment. This induced recrystallization and grain growth in both the copper core and Al sheath, reducing stiffness and tensile strength. This enabled successful ultrasonic bonding of 500-μm AICu wire onto aluminum chip pads of an IGBT chip without inducing damage. Crosssectional analysis confirmed good interface quality with no cracks or delamination. The findings demonstrate the feasibility of wire bonding of that heat-treated AlCu wire. It is known that Cu wire has a significantly higher reliability under thermal-mechanical load. Therefore, AlCu wire is a promising candidate for good bondability combined with enhanced reliability for power electronic.
Author(s)
Chen, Chun-Hao
National Yang Ming Chiao Tung University
Groth, Anne
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Jügel, Marvin  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Hempel, Martin  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Huang, Tzu-Ting
National Yang Ming Chiao Tung University
Dao, Thi Minh Anh
National Yang Ming Chiao Tung University
Mainwork
48th International Spring Seminar on Electronics Technology, ISSE 2025  
Conference
International Spring Seminar on Electronics Technology 2025  
DOI
10.1109/ISSE65583.2025.11121053
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Keyword(s)
  • AlCu wire

  • EBSD

  • power modules

  • ultrasonic bonding

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