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  4. High-temperature reliability of flip chip assemblies
 
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2006
Journal Article
Title

High-temperature reliability of flip chip assemblies

Author(s)
Braun, T.
Becker, K.-F.
Koch, M.
Bader, V.
Aschenbrenner, R.
Reichl, H.
Journal
Microelectronics reliability  
DOI
10.1016/j.microrel.2005.06.004
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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