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Technical challenges of stencil printing technology for ultra fine pitch flip chip bumping
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2002
Conference Paper
Title
Technical challenges of stencil printing technology for ultra fine pitch flip chip bumping
Author(s)
Manessis, D.
Patzelt, R.
Nieland, S.
Ostmann, A.
Aschenbrenner, R.
Reichl, H.
Mainwork
International Symposium on Microelectronics 2002. Proceedings
Conference
International Symposium on Microelectronics 2002
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM