English
Deutsch
Log In
Log in with Fraunhofer Smartcard
Password Login
Have you forgotten your password?
Research Outputs
Fundings & Projects
Researchers
Institutes
Statistics
Fraunhofer-Gesellschaft
Home
Fraunhofer-Gesellschaft
Artikel
New quantitative line scanning technique for homogeneity assessment of semi-insulating GaAs wafers
Details
Full
Export
Statistics
Options
Show all metadata (technical view)
1985
Journal Article
Title
New quantitative line scanning technique for homogeneity assessment of semi-insulating GaAs wafers
Author(s)
Baeumler, Martina
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Kaufmann, U.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Windscheif, J.
Journal
Applied Physics Letters
DOI
10.1063/1.95913
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Keyword(s)
Galliumarsenid
Homogenitaets-Kontrolle
Infrarotabsorption