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Fraunhofer-Institut für Produktionsanlagen und Konstruktionstechnik IPK
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PatentVorrichtung und Verfahren zur Pruefung der Gestalt einer Oberflaeche eines zu vermessenden Objektes( 1998)
;Koerner, K. ;Fritz, H. ;Nyarsik, L. ;Spur, G.Uhlmann, E.The description relates to a device for the topographical inspection of the surfaces of an object to be tested. The invention is characterized by the fact that it comprises the following components: - at least one light source, - at least one light-distributing surface, - at least one projection stage and - one detector for electromagnetic radiation.