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Thermo-mechanical analysis of advanced electronic packages in early system design

: Sommer, J.-P.; Wittler, O.; Manessis, D.; Michel, B.

Courtois, B. ; Tima-Cmp Laboratory; IEEE Circuits and Systems Society:
Design, Test, Integration and Packaging of MEMS / MOEMS. DTIP 2004. Proceedings : Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Montreux, Switzerland, 12 - 14 May 2004
Grenoble: TIMA Laboratory, 2004
ISBN: 2-8481-3026-1
Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP) <2004, Montreux>
Fraunhofer IZM ()

The thermal and thermo-mechanical behaviour of advanced electronic packages should be taken into account from the initial design phase in order to achieve a high level of reliability. Numerical studies by means of finite element (FE) analyses are very useful in order to reveal and evaluate the essential thermal and mechanical influences which are induced during manufacturing, storing, transport, and operation. Two different types of packages are under investigation, an RF-system on chip including digital and analogue parts on one chip (RF SoC), and combined in a BGA-type package, made by Shellcase Ltd., and a power transistor (PT) with all contacts on one side. Parametric FE analyses are presented in order to preoptimise the shape of the interconnects and to improve the compliance between stiff components before prototyping and real testing.