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Acquiring and processing light deflection maps for transparent object inspection

: Meyer, J.; Längle, Thomas; Beyerer, Jürgen

Volltext urn:nbn:de:0011-n-4260006 (2.2 MByte PDF)
MD5 Fingerprint: 1b0c481e3ee227edf816de8e939f0068
Erstellt am: 13.12.2016

Szczypiorski, K.:
ICFSP 2016, 2nd International Conference on Frontiers of Signal Processing : Warsaw, Poland, 15-17 October 2016
Warsaw, 2016
ISBN: 978-1-5090-3814-5
ISBN: 978-1-5090-3815-2
ISBN: 978-1-5090-3813-8
International Conference on Frontiers of Signal Processing (ICFSP) <2, 2016, Warsaw>
Konferenzbeitrag, Elektronische Publikation
Fraunhofer IOSB ()

Transparent objects play important roles in different sectors, e.g., they are employed in high precision optical systems or to guide laser beams in surgery. Hence, transparent materials have to meet high quality requirements. However, most of the existing elaborated automated inspection approaches are not applicable for the inspection of transparent materials-especially with respect to scattering inhomogeneities. Scattering material defects mainly cause a deflection of incident light rays away from their original optical path. This article proposes a novel optical system based on a transmission-type laser scanner that acquires so-called deflection maps of transparent objects. By means of two subsequent processing methods-one based on a spatial gradient calculation, the other relying on vector analysis-scattering material defects can be visualized even in test objects with a complex 3D-shape. Experiments performed using a first prototype and different test objects approve the proposed approach.