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Quantitative comparison of segmentation algorithms for FIB-SEM images of porous media

: Salzer, M.; Prill, T.; Spettl, A.; Jeulin, D.; Schladitz, K.; Schmidt, V.


Journal of microscopy 257 (2015), Nr.1, S.23-30
ISSN: 0022-2720
Fraunhofer ITWM ()

Focused ion beam tomography has proven to be capable of imaging porous structures on a nano-scale. However, due to shine-through artefacts, common segmentation algorithms often lead to severe dislocation of individual structures in z-direction. Recently, a number of approaches have been developed, which take into account the specific nature of focused ion beam-scanning electron microscope images for porous media. In the present study, we analyse three of these approaches by comparing their performance based on simulated focused ion beam-scanning electron microscope images. Performance is measured by determining the amount of misclassified voxels as well as the fidelity of structural characteristics. Based on this analysis we conclude that each algorithm has certain strengths and weaknesses and we determine the scenarios for which each approach might be the best choice.