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CMOS readout circuit integrated with ionizing radiation detectors

: Szymanski, Andrzej; Obrebski, Dariusz; Marczewski, Jacek; Tomaszewski, Daniel; Grodner, Miroslaw; Pieczynski, Janusz


International Journal of Electronics and Telecommunications 60 (2014), Nr.1, S.117-124
ISSN: 0867-6747
ISSN: 2081-8491
Fraunhofer IMS ()
readout electronics; ASIC; SOI; ionizing radiation detectors; application specific integrated circuits; readout-circuit; silicon process; test structure

This paper describes the work performed in ITE on integration in one CMOS chip the ionizing radiation detectors with dedicated readout electronics. At the beginning, some realizations of silicon detectors of ionizing radiation are presented together with most important issues related to these devices. Next, two developed test structures for readout electronics are discussed in detail together with main features of non-typical silicon process deployed.