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Morphology investigations by atomic force microscopy of thin films and substrates for excimer laser mirrors

 
: Kaiser, N.; Duparre, A.; Jakobs, S.

Bennett, H.E.; Chase, L.L. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Laser-Induced Damage in Optical Materials 1993. Proceedings
Bellingham/Wash.: SPIE, 1994 (SPIE Proceedings Series 2114)
ISBN: 0-8194-1407-7
pp.394-404
Laser-Induced Damage in Optical Materials Symposium <25, 1993, Boulder/Colo.>
Annual Boulder Damage Symposium <25, 1993, Boulder/Colo.>
Annual Symposium on Optical Materials for High-Power Lasers <25, 1993, Boulder/Colo.>
English
Conference Paper
Fraunhofer IOF ()
Dünne optische Schicht; excimer laser optics; Excimer-Laser-Optik; fluoride thin films; Fluoridschicht; laser induced damage threshold; Laserzerstörschwelle; optical coating; optical thin films; oxide thin films; Oxidschicht; ultraviolet spectral region; ultravioletter Spektralbereich; UV

Abstract
The surface microstructure of evaporated single layer and multilayer fluoride coatings for KrF lasers as well as the topography of uncoated fused silica substrates have been investigated with an atomic force microscope (AFM). The fluoride films exhibit a pronounced columnar microstructure that accounts for the typical surface morphology and causes surface roughness the magnetude of which depends on film thickness and substrate temperature. Well polished fused silica substrates show low surface roughness, which has been determined from both AFM and light scattering measurements.

: http://publica.fraunhofer.de/documents/PX-25148.html