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Modulation of laser diode parameters for special performance electronic speckle pattern interferometry (ESPI)

: Hinsch, K.D.; Joost, H.; Meinlschmidt, P.; Schlüter, F.


Optics communications 144 (1997), pp.12-16
ISSN: 0030-4018
Journal Article
Fraunhofer WKI ()
3-D ESPI; deformation monitoring; historical monument; laser diode; wavelength tuning

Sophisticated optical metrology like 3-D electronic speckle pattern interferometry (ESPI) benefits from the possibility to modulate diode laser sources. Modulation of light intensity is utilized to select branches of the optical setup designed for different sensitivity vectors. Phase shifting can be simplified by employing the tunability of the laser wavelenght. The wavelength characteristic within a laser pulse can be suitably tailored by adjusting the time dependence of the injection current signal. All features enter into the design of a powerful metrological tool for displacement studies under industrial or even out-of-doors environments like the monitoring of deterioration processes in historical monuments.