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Mapping the near-field interaction of silicon nanodisc arrays by automated dual-tip scanning near-field optical microscopy

 
: Abbasirad, N.; Arslan, D.; Berzins, J.; Fasold, S.; Staude, I.; Setzpfandt, F.; Pertsch, T.

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Institute of Electrical and Electronics Engineers -IEEE-:
Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference, CLEO/Europe-EQEC 2019 : 23-27 June 2019, Munich, Germany
Piscataway, NJ: IEEE, 2019
ISBN: 978-1-7281-0469-0
ISBN: 978-1-7281-0470-6
pp.1410
Conference on Lasers and Electro-Optics Europe (CLEO Europe) <2019, Munich>
European Quantum Electronics Conference (EQEC) <2019, Munich>
English
Conference Paper
Fraunhofer IOF ()

Abstract
Dual-tip scanning near-field optical microscopy (SNOM) facilitates high-precision spatial positioning of a point-like emitter and detector and has the capability of mapping optical near-field information very close to the dipole-like excitation. Hence, it opens new opportunities to characterize the optical near-field response of subwavelength photonic structures. Here we show that by using a fully automated dual-tip SNOM [1] the local field response of a metasurface, consisting of silicon nanodiscs [2] becomes accessible. In our measurements, one tip of the SNOM excited a single resonant nanodisc of sub-wavelength size, whereas the second tip mapped the near-field of the surrounding discs excited via in-plane coupling.

: http://publica.fraunhofer.de/documents/N-630178.html