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Attaining low uncertainties in measurements with RF signal generators and analyzers

: Beuster, N.; Raschke, F.; Ihlow, A.; Andrich, C.; Galdo, G. del


Institute of Electrical and Electronics Engineers -IEEE-; IEEE Instrumentation and Measurement Society:
I2MTC 2017, IEEE International Instrumentation and Measurement Technology Conference : May 22-25, 2017, Politecnico di Torino, Torino, Italy; 2017 proceedings papers
Piscataway, NJ: IEEE, 2017
ISBN: 978-1-5090-3597-7
ISBN: 978-1-5090-3596-0
International Instrumentation and Measurement Technology Conference (I2MTC) <2017, Torino>
Conference Paper
Fraunhofer IIS ()

In this paper, practical investigations of level accuracy and uncertainties using a Rohde & Schwarz signal generator (R&S SMB-B140) and spectrum analyzer (R&S FSV40) are performed up to 30GHz. We show that it is possible to measure frequency responses of DUTs with uncertainties below ±0.05dB up to 30 GHz instead of ±0.5...1.5dB using auto settings, standard setup, or relying on datasheets. The level linearity of instruments with integrated step attenuators is shown to be improved to ±0.03dB instead of ±0.3...1dB by using a special “hybrid” procedure. Furthermore, it is shown how computer aided measurements procedures should be programmed with these instruments to attain low deviations between measurements.