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Application of photo and particle acoustic methods

 
: Köhler, B.; Schubert, F.; Hentges, G.; Meyendorf, N.

:

Geer, R.E. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Testing, reliability, and application of micro- and nano-material systems III : Proceedings of the Third Conference on Testing, Reliability, and Application of Micro- and Nano-Material Systems; 8 - 10 March 2005, San Diego, California, USA
Bellingham/Wash.: SPIE, 2005 (SPIE Proceedings Series 5766)
ISBN: 0-8194-5747-7
pp.70-77
Conference on Testing, Reliability, and Application of Micro- and Nano-Material Systems <3, 2005, San Diego/Calif.>
English
Conference Paper
Fraunhofer IZFP, Institutsteil Dresden ( IKTS-MD) ()
laser acoustic; SEAM; CEFIT

Abstract
Several work performed at the Fraunhofer Institute IZFP Dresden on photo and particle acoustic methods is presented. It includes both, modeling activities by an explicit numerical method (CEFIT) and experimental work. The given examples of applied excitations are photons (Laser acoustics) and electrons (Scanning Electron Acoustic Microscopy, SEAM). Both, time resolved measurements by pulse excitation as well as monofrequent measurements by periodic excitation together with signal recovery (lock-in technique) are discussed.

: http://publica.fraunhofer.de/documents/N-29131.html