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Assessment of Influencing Factors on Lifetime-Based Defect Analysis

 
: Post, R.; Niewelt, T.; Kwapil, W.; Schubert, M.C.

:
Volltext urn:nbn:de:0011-n-6181796 (687 KByte PDF)
MD5 Fingerprint: 95a9243914395145425c2dda5987264c
Erstellt am: 9.12.2020

Poster urn:nbn:de:0011-n-618179-14 (818 KByte PDF)
MD5 Fingerprint: da9d8c267c9f48636ed91c51d7e07eea
Erstellt am: 16.2.2021


Pearsall, Nicola (Editor):
37th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2020 : 07-11 September 2020, Online Conference
M√ľnchen: WIP, 2020
ISBN: 3-936338-73-6
S.332-335
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <37, 2020, Online>
Englisch
Konferenzbeitrag, Elektronische Publikation
Fraunhofer ISE ()
Photovoltaik; lifetime spectroscopy; Silicium-Photovoltaik; Charakterisierung von Prozess- und Silicium-Materialien

Abstract
Since most detection methods are not sensitive enough to detect and characterize recombination active defects in silicon lifetime spectroscopy is an important method in silicon photovoltaics. It is a powerful tool, that can determine the defect parameters Et and k via the analysis of defect parameter solution surfaces. But despite being a crucial method there is no convention for the assessment of uncertainties. This work lines out a possible way to characterize the uncertainty of the method by a simulation of statistical noise onto lifetime curves following the Shockley-Read-Hall-statistics. The uncertainty analysis is done for one exemplary set of defect parameters. It outlines how prone to wrongful parametrization this method can be, if not conducted with great care. Thereby the suggested approach can act as a tool to decrease the uncertainty of the method by understanding, which influences are most crucial to control.

: http://publica.fraunhofer.de/dokumente/N-618179.html