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Performance and failure analysis of concentrator solar cells after intensive stressing with thermal, electrical, and combined load

: Eltermann, F.; Ziegler, L.; Wiesenfarth, M.; Wilde, J.; Bett, A.W.

Postprint urn:nbn:de:0011-n-4706697 (1.7 MByte PDF)
MD5 Fingerprint: 2876398e6580c30533f717c6add73ceb
Erstellt am: 26.1.2018

Siefer, G. ; American Institute of Physics -AIP-, New York:
13th International Conference on Concentrator Photovoltaic Systems, CPV 2017 : 1-3 May 2017, Ottawa, Canada
New York, N.Y.: AIP Press, 2017 (AIP Conference Proceedings 1881)
ISBN: 978-0-7354-1561-4
Art. 050002, 8 S.
International Conference on Concentrator Photovoltaic Systems (CPV) <13, 2017, Ottawa>
Konferenzbeitrag, Elektronische Publikation
Fraunhofer ISE ()
Kaufmännische und technische Dienste; Photovoltaik; III-V und Konzentrator-Photovoltaik; III-V Epitaxie und Solarzellen; Konzentrator-Bauelemente; reliability

In this work, we investigated the impact of intensive heat loads on concentrator solar cells assemblies. As test samples, we employed lattice-matched and lattice-mismatched triple-junction solar cells made of GaInP/GaInAs/Ge. The thermal loads were induced by different manners. We used drying cabinets, external power supplies, and a combination of both to achieve maximum test temperatures of 180 °C. For the performance analysis, we utilized flash light solar simulators and an electroluminescence (EL) imaging tool. Our experiments revealed a significant difference depending on the applied manner of heating. The highest impact was observed for the pure heat treatment in drying cabinets. This was particularly visible in the spatial EL images, but also in the IV curves. In contrast, running the concentrator solar cells as forward-biased diodes using an external current supply of 2000 mA, which corresponds to 2000 suns, did not lead to any significant changes in EL and IV curves. However, deformation of the front metallization was observed. In conclusion, pure heat treatment can be considered as a cost-efficient alternative to pinpoint weak points in solar cell receivers.