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From Injection Dependent Lifetime to Solar Cell Efficiency

: Michl, B.; Rüdiger, M.; Giesecke, J.A.; Hermle, M.; Warta, W.; Schubert, M.C.

Volltext urn:nbn:de:0011-n-2210577 (574 KByte PDF)
MD5 Fingerprint: 64bc9c384dfccd4a87e10e7f24fc8879
Erstellt am: 7.12.2012

European Commission:
26th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC. Proceedings : 5th to 9th September 2011 at the CCH - Congress Centre and International Fair Hamburg in Germany
München: WIP-Renewable Energies, 2011
ISBN: 3-936338-27-2
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <26, 2011, Hamburg>
Konferenzbeitrag, Elektronische Publikation
Fraunhofer ISE ()
Solarzellen - Entwicklung und Charakterisierung; Silicium-Photovoltaik; Charakterisierung von Prozess- und Silicium-Materialien; Herstellung und Analyse von hocheffizienten Solarzellen; Charakterisierung; Zellen und Module

In this work we analyze the solar cell efficiency limitations of multicrystalline material due to bulk recombination. We measure, spatially resolved, the injection dependent bulk lifetime of a surface passivated wafer and combine that information with a simple cell simulation. Hence, we can calculate the open-circuit voltage, the short-circuit current and the fill factor limit for every image point. To attain global values we discuss the effect of the emitter on the excess carrier distribution with Sentaurus Device and Spice network simulations. For comparison to solar cells, we analyze wafers that have undergone the relevant high temperature steps of a solar cell process. The calculated global values match very well to measured values on finished solar cells from neighboring wafers. With this procedure we could observe severe losses in short-circuit current in dislocated areas on the wafer and also show why the fill factor of multicrystalline cells is limited by the bulk material.