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Potential new approaches to ultrasonic quantitative NDE (QNDE) by combining high speed defect reconstruction procedures based on sampling phased array techniques with probabilistic failure assessment

: Dobmann, G.

Fulltext urn:nbn:de:0011-n-884922 (2.4 MByte PDF)
MD5 Fingerprint: 5c6721c683c6618903dc99dc759ccf05
Created on: 27.8.2009

International Committee for Non-Destructive Testing -ICNDT-; Chinese Society for Non-destructive Testing -ChSNDT-:
17th World Conference on Nondestructive Testing : Shanghai, China, October 25 - 28, 2008
Shanghai, 2008
Paper 438
World Conference on Nondestructive Testing (WCNDT) <17, 2008, Shanghai>
Conference Paper, Electronic Publication
Fraunhofer IZFP ()
inservice inspection; high speed; online and real time reconstruction; sampling phased array; failure assessment diagram (FAD)

An optimized phased array transducer with sector scan or compound scan in medical application obviously provides tomographic images of hidden objects in the human body which are nearly comparable with photographs. Solid state materials of technical components - the objects of NDT - have other elastic properties compared with the human body. Therefore the imaging task is more difficult. However, to increase the inspection speed for scanning including an online reconstruction is a general enhancement task for both of the applications. In medicine the doctor want to see, for instance, the pumping of the heart of the foetus in real time, in nuclear industry we want to reduce the inspection time in order to safe costs and to reduce the irradiation dose of personnel. New computing facilities like FPGA, DSP, and high-speed graphic plug-in boards allow to reconstruct inspection images in NDT now also in real time. Combining these possibilities with the integration of the SAFT technique using the sampling phased array (SPA)[1] approach has as result a virtual focusing by computation on each individual pixel in the image sector space. Compared with the classic phased array the SPA has the advantage of the much smaller near field length of the given point source. As far as the stochastic distribution of the material properties (yield and tensile strength, fracture toughness) are known[2] as well as the probability of detection of an individual defect[3] the failure assess diagram allows the probabilistic prediction of the risk of failure.