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Using TDL for Standardised Test Purpose Definitions

: Makedonski, Philip; Gheorghe-Pop, Ilie-Daniel; Rennoch, Axel; Kristoffersen, Finn; Pintar, Bostjan; Ulrich, Andreas

Preprint urn:nbn:de:0011-n-5970058 (471 KByte PDF)

MD5 Fingerprint: 6fca90a9551e00f1921edc22da709feb

Created on: 5.8.2020

DOI: 10.1109/QRS-C51114.2020.00091

	Institute of Electrical and Electronics Engineers -IEEE-; IEEE Reliability Society: Companion of the IEEE 20th International Conference on Software Quality, Reliability and Security, QRS-C 2020. Proceedings : 11-14 December 2020, Macau, China Los Alamitos, Calif.: IEEE Computer Society Conference Publishing Services (CPS), 2020 ISBN: 978-1-7281-8915-4 ISBN: 978-1-7281-8916-1 pp.514-521
	International Conference on Software Quality, Reliability, and Security Companion (QRS-C) <20, 2020, Macau> Workshop on System Testing and Validation (STV) <13, 2020, Macau>

	English
	Conference Paper, Electronic Publication
	Fraunhofer FOKUS ()
	test description; test purposes; security; performance; interoperability; CoAP; MQTT; IoT; VxLTE

Abstract
This article reports on experiences from the use of the ETSI Test Description Language (TDL) and its extension for structured test objective specification (TDL-TO) for the definition of functional and non-functional test purposes in the Internet of Things (IoT) domain. The experiences are based on results from different working groups at ETSI TC MTS and the ETSI Specialist Task Force (STF) 574, focusing on the definition of test purposes for functional, security, and performance testing of the CoAP and MQTT protocols as well as VxLTE interoperability testing.

: http://publica.fraunhofer.de/documents/N-597005.html