Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Learning Quality Rating of As-Cut mc-Si Wafers via Convolutional Regression Networks
Demant, M.; Virtue, P.; Kovvali, A.; Yu, S.X.; Rein, S.
Zeitschriftenaufsatz
2019Re-evaluation of the SRH-Parameters for the FeGa Defect
Post, R.; Niewelt, T.; Yang, W.; Macdonald, D.; Kwapil, W.; Schubert, M.C.
Konferenzbeitrag
2019Vignetting in Luminescence Imaging of Solar Cells
Dost, G.; Höffler, H.; Greulich, J.M.
Zeitschriftenaufsatz
2017Characterization of the diamond wire sawing process for monocrystalline silicon by raman spectroscopy and SIREX polarimetry
Würzner, S.; Herms, M.; Kaden, T.; Möller, H.J.; Wagner, M.
Zeitschriftenaufsatz
2016Material limits of silicon from state-of-the-art photoluminescence imaging techniques
Schindler, F.; Giesecke, J.; Michl, B.; Schön, J.; Krenckel, P.; Riepe, S.; Warta, W.; Schubert, M.C.
Konferenzbeitrag
2012Atomic force microscopy - what is it all about, and what does it tell us about the microstructure of metals?
Hirsekorn, Sigrun
Konferenzbeitrag
2012Non-destructive testing with micro and MM waves - Where we are and where we go
Dobmann, Gerd; Altpeter, Iris; Sklarczyk, Christoph; Pinchuk, Roman
Zeitschriftenaufsatz
2008Progress in NDT system engineering through sensor physics and integrated efficient computing
Kröning, M.; Ribero, J.G.; Vidal, A.
Konferenzbeitrag
2007Progress in NDT system engineering through sensor physics and integrated efficient computing
Kröning, M.; Ribeiro, J.G.; Vidal, A.
Konferenzbeitrag
2006Advanced ultrasonic NDT of aero engine components using standard transducers and optimized mirrors
Spies, M.; Bamberg, J.
Konferenzbeitrag