Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2021Fast and Accurate Short-Circuit Current versus Irradiance Determination of a Spectrally Nonlinear Solar Cell Using a Spectral Shaping Setup
Mühleis, M.; Kröger, I.; Hohl-Ebinger, J.
Zeitschriftenaufsatz
2021Learning an Empirical Digital Twin from Measurement Images for a Comprehensive Quality Inspection of Solar Cells
Kunze, P.; Rein, S.; Hemsendorf, M.; Ramspeck, K.; Demant, M.
Zeitschriftenaufsatz
2021Programmable Spectral Shaping Demonstrated at the Solar Spectral Irradiance Distribution
Mühleis, M.; Hohl-Ebinger, J.
Zeitschriftenaufsatz
2020The Crystal Growth Explorer: Real-Time Navigable 3D Visualization of Silicon Grains and Defect Related Data in Cast-Mono and Multicrystalline Bricks
Schönauer, J.; Demant, M.; Trötschler, T.; Kovvali, A.S.; Schremmer, H.; Krenckel, P.; Riepe, S.; Rein, S.
Konferenzbeitrag
2020Mechanical metamaterials on the way from laboratory scale to industrial applications: Challenges for characterization and scalability
Fischer, Sarah C.L.; Hillen, Leonie; Eberl, Chris
Zeitschriftenaufsatz
2019Measurement Uncertainties in the Calibration of Multi-Junction Solar Cells using Different Sun Simulators and Reference Devices
Reichmuth, S.K.; Siefer, Gerald; Schachtner, Michael; Mühleis, Matthias; Hohl-Ebinger, Jochen; Glunz, Stefan W.
Konferenzbeitrag
2019Multivariate Statistical Modelling to Correlate PECVD Layer Properties with Plasma Chemistry during Silicon Nitride Deposition
Rachdi, L.; Hofmann, M.
Konferenzbeitrag
2018Characterization and modeling of airbag fabrics subjected to asymmetric biaxial loading and elevated temperatures
Boljen, Matthias; Rack, Nils Alexander; Kölble, Florian; Rodinger, Silvia; Harwick, Wilfried
Konferenzbeitrag
2018Inline Characterization of Diamond Wire Sawn Multicrystalline Silicon Wafers
Haunschild, J.; Bergmann, N.; Hammer, T.; Krieg, K.; Kaden, T.; Anspach, O.; Schremmer, H.; Rein, S.
Konferenzbeitrag
2018Inline Wafer Identification Using Optical Character Recognition (OCR)
Al-Hajjawi, S.; Hammer, T.; Haunschild, J.
Konferenzbeitrag
2018IV-Measurements of Bifacial Solar Cells in an Inline Solar Simulator with Double-Sided Illumination
Krieg, A.; Greulich, J.; Ramspeck, K.; Dzafic, D.; Wöhrle, N.; Rauer, M.; Rein, S.
Konferenzbeitrag
2018Understanding InP nanowire array solar cell performance by nanoprobe-enabled single nanowire measurements
Otnes, Gaute; Barrigón, Enrique; Sundvall, Christian; Svensson, K. Erik; Heurlin, Magnus; Siefer, Gerald; Samuelson, Lars; Åberg, Ingvar; Borgström, Magnus T.
Zeitschriftenaufsatz
2017FEM-based development of novel back-contact PV modules with ultra-thin solar cells
Beinert, Andreas; Leidl, Roman; Sommeling, Paul; Eitner, Ulrich; Aktaa, Jarir
Konferenzbeitrag
2017Identification of defect-suppressing grain boundaries in multicrystalline silicon based on measurements of as-cut wafers using advanced image processing
Strauch, T.; Demant, M.; Krenckel, P.; Riepe, S.; Rein, S.
Konferenzbeitrag
2017The influence of material properties on the wire sawing process of multicrystalline silicon
Kaden, T.; Ershova, E.; Lottspeich, L.; Fuchs, M.
Konferenzbeitrag
2017A novel approach to determine the diamond occupancy of diamond wires for optimized cutting processes for crystalline silicon
Lottspeich, L.; Theophil, L.; Fuchs, M.; Kaden, T.
Konferenzbeitrag
2017Ultrafast in-line capable regeneration process for preventing light induced degradation of boron-doped p-type Cz-silicon PERC solar cells
Brand, A.; Krauß, K.; Wild, P.; Schörner, S.; Gutscher, S.; Roder, S.; Rein, S.; Nekarda, J.
Konferenzbeitrag
2016Analysis of grain structure evolution via image processing based on optical measurements of mc Si wafers
Strauch, T.; Demant, M.; Krenckel, P.; Riepe, S.; Rein, S.
Konferenzbeitrag
2016Investigation of UV-Induced Degradation of Different Types of WPVS Reference Solar Cells
Kröger, I.; Hohl-Ebinger, J.; Brachmann, S.; Winter, S.
Konferenzbeitrag
2016A sensitivity analysis of the stepwise measurement procedure for the characterization of large area PV modules
Rapp, C.; Steiner, M.; Siefer, G.; Bett, A.W.
Zeitschriftenaufsatz
2016Transient I-V Measurement Set-up for Photovoltaic Laser Power Converters under Monochromatic Irradiance
Reichmuth, S.K.; Helmers, H.; Garza, C.E.; Vahle, D.; Boer, M. de; Stevens, L.; Mundus, M.; Helmers, H.; Bett, A.W.; Siefer, G.
Konferenzbeitrag
2015Photoluminescence-based current-voltage characterisation of individual subcells in multi-junction devices
Alsonso-Álvarez, D.; Lackner, D.; Philipps, S.P.; Bett, A.W.; Ekins-Daukes, N.J.
Konferenzbeitrag
2015Quantum efficiency measurement of concentrator photovoltaic modules
Mundus, M.; Rapp, C.; Missbach, T.; Siefer, G.; Hohl-Ebinger, J.; Bett, A.W.; Warta, W.
Konferenzbeitrag
2015Spectrally shaped supercontinuum for advanced solar cell characterization
Mundus, M.; Kumar Dasa, M.; Wang, X.; Hohl-Ebinger, J.; Warta, W.
Konferenzbeitrag
2014Advanced spectral response measurement with wide range tunable laser system
Mundus, M.; Lill, D.; Hohl-Ebinger, J.; Warta, W.
Konferenzbeitrag
2014Characterization of optics for concentrating photovoltaic and solar thermal applications
Hornung, T.; Kiefel, P.; Heimsath, A.; Schmid, T.; Schmidt, T.; Nitz, P.
Konferenzbeitrag
2014New Defect Luminescence Scanner for Inline Control of Material Quality
Kallinger, Birgit; Kaminzky, Daniel; Berwian, Patrick; Oppel, Steffen; Schütz, Michael; Schneider, Adrian; Krieger, Michael; Weber, Jonas; Friedrich, Jochen
Poster
2013Can anti-soiling coating on solar glass influence the degree of performance loss over time of PV modules drastically
Klimm, E.; Lorenz, T.; Weiss, K.-A.
Konferenzbeitrag
2013Improved grating monochromator set-up for EQE measurements of multi-junction solar cells
Siefer, G.; Gandy, T.; Schachtner, M.; Wekkeli, A.; Bett, A.W.
Konferenzbeitrag
2013Indoor characterization of reflective concentrator optics
Schmid, T.; Frick, M.; Hornung, T.; Nitz, P.
Konferenzbeitrag
2013Investigations on the influence of temperature and concentration on solar cell performances
Helmers, H.; Schachtner, M.; Bett, A.W.
Konferenzbeitrag
2011Characterization of digital cells for statistical test
Hopsch, F.; Lindig, M.; Straube, B.; Vermeiren, W.
Konferenzbeitrag
2010Investigation of dominant loss mechanisms in low-temperature polymer electrolyte membrane fuel cells
Gerteisen, D.
Dissertation
2008Detailed arsenic concentration profiles at Si/SiO2 interfaces
Pei, L.; Duscher, G.; Steen, C.; Pichler, P.; Ryssel, H.; Napolitani, E.; Salvador, D. de; Piro, A.M.; Terrasi, A.; Severac, F.; Cristiano, F.; Ravichandran, K.; Gupta, N.; Windl, W.
Zeitschriftenaufsatz
2008Tunneling atomic-force microscopy as a highly sensitive mapping tool for the characterization of film morphology in thin high-k dielectrics
Yanev, V.; Rommel, M.; Lemberger, M.; Petersen, S.; Amon, B.; Erlbacher, T.; Bauer, A.J.; Ryssel, H.; Paskalev, A.; Weinreich, W.; Fachmann, C.; Heitmann, J.; Schroeder, U.
Zeitschriftenaufsatz
2007Cathodoluminescence characterization of organic semiconductor materials for light emitting device applications
Wellmann, P.J.; Karl, U.; Kleber, S.; Schmitt, H.
Zeitschriftenaufsatz