Fraunhofer-Gesellschaft

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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Learning Quality Rating of As-Cut mc-Si Wafers via Convolutional Regression Networks
Demant, M.; Virtue, P.; Kovvali, A.; Yu, S.X.; Rein, S.
Zeitschriftenaufsatz
2019Visualizing Material Quality and Similarity of mc-Si Wafers Learned by Convolutional Regression Networks
Demant, M.; Virtue, P.; Kovvali, A.; Yu, S.X.; Rein, S.
Zeitschriftenaufsatz
2018Deep Learning Approach to Inline Quality Rating and Mapping of Multi-Crystalline Si-Wafers
Demant, M.; Virtue, P.; Kovvali, A.S.; Yu, S.X.; Rein, S.
Konferenzbeitrag